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Understanding Educational Quality: Where Validity Meets TechnologyLink: http://www.ets.org/research/pic/angoff5.pdf On Nov. 8, 1998, Dr. Eva L. Baker, of the University of California, Los Angeles and National Center for Research on Evaluation, Standards and Student Testing (CRESST) presented a William H. Angoff Memorial Lecture. She focuses on testing and technology and the connections between the two.
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